Nagano, Japan, June 18, 2026 – Hioki E.E. Corporation today announced the launch of the Current Probe CT6704 and Current Probe CT6705, two new current probes designed for current waveform observation in high-frequency, large-current measurement applications.
The CT6704 and CT6705 are intended for R&D and evaluation in power electronics, mobility, industrial equipment, and data center-related equipment. Typical applications include current waveform observation in SiC/GaN inverters, DC/DC converters, motor drive circuits, high-frequency power supplies, and battery backup units.
With the launch of these products, Hioki will strengthen its measurement solution offerings for growth markets where power conversion technology is becoming increasingly important, including electrification, renewable energy, and data centers.

Development Background

Power conversion equipment used in electric vehicles, renewable energy systems, industrial equipment, and data center power systems is becoming more efficient and compact. This trend is driving the adoption of wide-bandgap semiconductors such as SiC (Silicon Carbide) and GaN(Gallium Nitride), because these materials provide higher switching frequencies and larger current levels.

In these development environments, engineers need to accurately observe steep current changes, ringing(*1), transient responses, and other switching phenomena. Current waveform observation is essential for loss analysis, thermal design, noise countermeasures, and reliability evaluation in power electronics equipment.

However, high-frequency, large-current measurements present challenges, including temperature drift caused by heat generated by the current probe itself and limitations on the usable measurement range due to inductive heating. Stable and repeatable measurements are especially important during long-duration waveform observation and under demanding evaluation conditions.

The CT6704 and CT6705 were developed to address these needs as next-generation current probes for high-frequency, large-current measurement, drawing on Hioki's long-standing expertise in current measurement technology and oscilloscope current probes.

• *1 Ringing
  High-frequency oscillation or overshoot that occurs during switching. This phenomenon is caused by resonance between the circuit's parasitic inductance and parasitic capacitance when semiconductor devices turn on and off.

Key Features

1. Stable waveform observation with low drift

The CT6704 and CT6705 use a fluxgate detection method to suppress offset drift caused by sensor self-heating, supporting stable current waveform measurement during long-duration observation and in environments subject to temperature changes.

2. Reduced inductive heating during high-frequency, large-current measurement

A redesigned sensor core reduces inductive heating during high-frequency, large-current measurement, expanding the usable range under frequency derating conditions and supporting stable measurement under demanding conditions.

3. Wideband performance for high-speed current waveforms

The CT6704 supports a frequency bandwidth of DC to 30 MHz, while the CT6705 supports DC to 15 MHz. These probes help capture steep current changes and transient responses in SiC/GaN inverters, DC/DC converters, motor drive circuits, and other applications.

4. BNC output for easy integration

With BNC output, the CT6704 and CT6705 can be used with various oscilloscopes and Hioki's MR6000 Memory HiCorder, allowing users to introduce the probes into existing measurement environments without relying on a specific oscilloscope brand.

Target Applications

The CT6704 and CT6705 are intended for applications such as:

• Current waveform observation in SiC/GaN inverters
• Confirmation of switching current in double-pulse testing
• Transient response evaluation of DC/DC converters and AC/DC power supplies
• Phase current and switching current measurement in motor and inverter development
• Evaluation of high-frequency power supplies and induction heating equipment
• Observation of high-speed current transients in battery backup units and related equipment

Product Overview

	Main specifications
CT6704 Current Probe	DC to 30 MHz, rated current 200 A
CT6705 Current Probe	DC to 15 MHz, rated current 500 A

Links

For more information about Hioki Current Probe CT6704 and CT6705, please visit: 
CT6704 Current Probe product page
CT6705 Current Probe product page

Contact Us

For inquiries such as quotes, demonstrations, and trial usage, please use Hioki's contact form for a personalized reply from your closest Hioki representative.

• The information provided is current as of the date of publishing.
• Please note that prices, specifications, and other information contained in this texts are subject to change without notice.
• The company names and product names used in this text are registered trademarks or trademarks of their respective companies.

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