C HiTESTER 3504

3504-50, 3504-60

Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The 3504 series are dual-band capacitance meters suited for large-capacitance MLCC inspections using a constant voltage.

Key Features

High speed measurement of 2ms
Supports C measurements with voltage dependency characteristics through the use of constant voltage testing (CV)
Model 3504-60 can detect contact failure on all 4 terminals for increased reliability
BIN function on the 3504-60/-50 is ideal for sorting machines
Model 3504-40 offers high speed and affordability, perfect for integrating into taping machines
In all models, contact error is constantly monitored during measurement, contributing to increased yield

Model No. (Order Code)

3504-40	Built-in RS-232C interface
3504-50	Built-in GP-IB, RS-232C
3504-60	Built-in GP-IB, RS-232C

This product is not supplied with measurement probes or test fixtures. Please select and purchase the measurement probe or test fixture options appropriate for your application separately. For an RS-232C connection: A crossover cable for interconnection can be used. You can use the RS-232C CABLE 9637 without hardware flow control.

Basic specifications

Accuracy guaranteed: 6 months

Measurement parameters	C (capacitance), D (loss coefficient tan δ)
Measurement range	C: 0.9400 pF to 20.0000 mF, D: 0.00001 to 1.99999
Basic accuracy	(Typ.) C: ±0.09 % rdg. ±10 dgt., D: ±0.0016
Measurement frequency	120 Hz, 1 kHz
Measurement signal level	100 mV (3504-60 only), 500 mV, 1 V rms CV 100 mV Measurement range: up to 170 μF range (Source frequency 1 kHz), up to 1.45 mF range (Source frequency 120 Hz) CV 500 mV Measurement range : up to 170 μF range (Source frequency 1 kHz), up to 1.45 mF range (Source frequency 120 Hz) CV 1V Measurement range : up to 70 μF range (Source frequency 1 kHz), up to 700 μF range (Source frequency 120 Hz)
Output impedance	5Ω (In open terminal voltage mode outside of the CV measurement range)
Display	LED (six digits, full scale count depends on measurement range)
Measurement time	2 ms (Typ. value. Depends on measurement configuration settings)
Functions	4-terminal contact check function (3504-60 only) BIN (measurement values can be classified by rank) (3504-50, 3504-60), Trigger-synchronous output, Setting configurations can be stored, Comparator, Averaging, Low-C reject (bad contact detection), Chatter detection, EXT. I/O, RS-232C, GP-IB (3504-50, 3504-60)
Power supply	Selectable from 100, 120, 220 or 240 V AC ±10 %, 50/60 Hz, 110 VA max.
Dimensions and mass	260 mm (10.24 in) W × 100 mm (3.94 in) H × 220 mm (8.66 in) D, 3.8 kg(134.0 oz)
Included accessories	Power cord ×1, Instruction manual ×1, Spare fuse ×1

Probe and Test fixtures (9)

CONTACT TIPS IM9901

To replace the tip on the L2001, regular size, bundled with the L2001

CONTACT TIPS IM9902

To replace the tip on the L2001, small size

PINCHER PROBE L2001

Learn more

• DC to 8MHz, 50Ω termination
• Tip electrode spacing: 0.3 to 6 mm
• Measurable sample sizes: 0201 to 2220 (inch)

4-TERMINAL PROBE 9140

DC to 100 kHz, 1 m (3.28 ft) length, impedance characteristics of 75 Ω

TEST FIXTURE 9261

DC to 8 MHz, 1 m (3.28 ft) length, impedance characteristics of 75 Ω

TEST FIXTURE 9262

Direct connection type, DC to 8 MHz（Can be measured up to 10 MHz, when combined with the special order model IM3536-01）, measurable conductor diameter: ø0.3 (0.01 in) to 2 mm (0.08 in)

SMD TEST FIXTURE 9263

Direct connection type, DC to 8 MHz（Can be measured up to 10 MHz, when combined with the special order model IM3536-01）, Test sample dimensions:1 mm (0.04 in) to 10 mm (0.39 in)

SMD TEST FIXTURE 9677

Direct connection type, For measuring SMDs with electrodes on the side; DC to 120 MHz, test sample dimensions: 3.5 mm ±0.5 mm (0.14 in ±0.02 in)

SMD TEST FIXTURE 9699

Direct connection type, For measuring SMDs with electrodes on the bottom; DC to 120 MHz, test sample dimensions: 1.0 mm (0.04 in) to 4.0 mm (0.16 in) wide, max. 1.5 mm (0.06 in) high