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・Measures leakage 0.060 mA (resolution 10 μA) to load 200.0 A
・Output function (waveform/RMS), external power supply
・Easy visualization of intermittent trip events (when the Z3210 is installed)

• Detect minuscule leakage currents with a newly designed sensor (IEC/EN 61557-13 compliant)
• Set product of wireless data transfer Z3210 is available

・Measures leakage 0.060 mA (resolution 10 μA) to load 200.0 A
・Easy visualization of intermittent trip events (when the Z3210 is installed)
・Solve GFCI and RCD problems quickly

• Detect minuscule leakage currents with a newly designed sensor (IEC/EN 61557-13 compliant)
• Set product of wireless data transfer Z3210 is available

• Earth resistance measurements for multi-grounded systems
• Leak to load current
• CAT IV 600 V, True RMS

• Clamp ground wires with ease without digging or disconnecting cables
• Set product of wireless data transfer Z3210 is available

• 5 ranges from 50 to 1000 V
• 200 mA continuity check

• Digital bargraph
• Stable & high-speed readings with 0.3 second response time for PASS/ FAIL decisions
• Set product of wireless data transfer Z3210 is available

• Non- metalic measure voltage and detect phase sequence simultaneously
• 90 to 520 V AC
• φ 6 - 30 mm (0.24 - 1.18 in) core dia.

• Eliminates the risk of electric shock while performing electrical work in the field
• Set product of wireless data transfer Z3210 is available

• 3-pole or 2-pole method
• Supports Class A to Class D ground types
• IP67 protected – top in the industry

• Wide 0Ω to 2000Ω measurement range
• Thin, rigid, corrosion-resistance stainless steel grounding rods included
• Set product of wireless data transfer Z3210 is available

Leakage to load

0.60 mA (resolution 10 μA) to 600.0 A

Inrush current measurement

• Innovative teardrop jaw lets you get between crowded wiring with ease
• Set product of wireless data transfer Z3210 is available

• Detect significant points that can cause latent board defects

• Detect latent defects with AI
• Data analysis utilizing high-precision measurement technology

• For research and development of Li-ion batteries
• Isolates and quantifies composite layer resistance and interface resistance in positive- and negative-electrode sheets

• Resistance measurement system to analyze the surface of the LIB electrode sheets in order to improve battery quality at the component level

Line measurement

4 ch for 1P2W, 1P3W, 3P3W, 3P4W

50 Hz, 60 Hz, 400 Hz

Max.

6000 V peak transient, 6000 A AC

• IEC61000-4-30 Ed.3 Class A Power Quality Analyzer
• Advanced monitoring and recording

• Third-party software
• For detailed analysis of Memory HiCorder data

• Multi-lingual, advanced software for analysis and presentation of Memory HiCorder data

• Automatically pair with LAN-connected measuring instruments
• Display acquired data graphically in real-time
• Windows compatible

• Free PC software for compatible Hioki measuring instruments

• DIN 5032-7:1985 class B
• 0 to 200 000 lx
• Memory function
• Built-in Bluetooth® wireless technology

• Light meter to evaluate illumination equipment and lighting work
• Measure and record illumination data for building inspections

• Easily inspect bypass diodes for open and short-circuit faults even in broad daylight
• Easily test using the strings in the junction boxes

• Innovative bypass diode tester for photovoltaic systems to vastly improve work efficiency
• Send data to mobile device via Bluetooth(R)

Channels

4ch, DC, or 1P2W to 3P4W

Frequency band

DC, 0.5 Hz to 200 kHz

Power accuracy (50 Hz/60 Hz)

0.04% of reading + 0.05% of range

• Measure inverter equipment and analyze motors
• Test up to 4000 A AC/DC with superior accuracy

Line measurement

4 ch for 1P2W, 1P3W, 3P3W, 3P4W

50 Hz, 60 Hz

Max.

2.200 kV peak transient, 6000 A AC

• IEC61000-4-30 Ed.3 Class S Power Quality Analyzer
• Advanced monitoring and recording

• 4 arms, max. 100 points/sec
• 35um minimum pad pitch (with CP1075-09)(when using FA1971-01)
40um minimum pad pitch (with CP1075-09)
• 5um minimum pad size (with CP1075-09)(when using FA1971-01)
10um minimum pad size (with CP1075-09)

• Horizontal-loading double-sided flying probe tester
• Inspection from general bare boards to fine and high density substrates such as flexible substrates and CSP

• 3-in-1 for editing, test-point generation, and built-in component support
• New Windows-optimized algorithm
• Free from data volume restrictions for increased freedom
• Added new commands to reduce data generation time by half

• Gerber data editing software that embodies the know-how for substrate testing
• Reduce data generation time by 50% with new platform

・10 mHz - 100 kHz FG
・Max. 15 V output
・2 channels

・Signal generator module for Memory HiCorders
・Output up to 2 channels of arbitrary waveform for simulation testing

• For Hioki Data Loggers and Memory HiLoggers
• Software for CAN unit settings
• Receive channel definition settings
• Save and load CAN bus definition files

View a trend graph and scroll back to view earlier waveform data, even while recording