X-Y BOARD HiTESTER 1270, 1271

Double-sided Board Tester with Maximum Measurement Speed of 0.015 s/step

The 1270 and 1271 are fixtureless, dual-sided, bare board testers that provide superior cost performance. Using a total of four arms, two in front and two in back, it is capable of simultaneously testing both sides of an optional board, and is available with a 4-terminal resistance measurement function that enables measurement of very small resistances in IVH or through holes.

Key Features

  • Double-sided, simultaneous testing with a total of 4 arms (2 front, 2 back)
  • Detection of invisible defects such as cracks thank to a pin low-resistance measurement function (optional feature)
  • Extensive testing capabilities in addition to continuity testing and capacitance measurement (*1)
  • High-speed testing at up to 0.012 sec./step while maintaining a high level of precision
  • High resolution of 5 aF to ensure reliable detection of minute changes in capacitance caused by defects (1 aF = 10^-6 pF)
  • Reliable probing of fine-pitch minute pads thanks to a minimum pad diameter of 20 μm
  • Support for insulation dielectric strength testing with test voltages of up to 250 V (optional feature)
  • High-speed soft landing function and shock-absorbing probes to minimize probe impact marks
  • Automation of operations required in order to acquire test reference values and simple acquisition of basic data

    *1:

  • Short and break testing using the insulation and continuity testing method
  • Short and break testing using the CR testing method
  • Short and break testing using the capacitance measurement method
  • Resistance testing of IVHs and through-holes (optional 4-terminal low-resistance measurement)
  • Measurement of constants of embedded elements with L, C, R, and D measurement

Model No. (Order Code)

1270 Discontinued, Board size : 50 × 50 to 400 × 330 mm
1271 Discontinued, Board size : 50 × 70 to 610 × 510 mm

Specifications overview

  1270 1271
Number of arms 4 (2 front, 2 back)
Number of test steps Max. 40,000 (during continuous testing, 300,000)
Measurement time Max. 84 steps/sec. (0.1 mm movements, simultaneous probing with 4 arms, capacitance measurement)
Minimum pad diameter φ 20 μm
Probe working area 394 mm (15.51 in) W × 324 mm (12.76 in) D 604 mm (23.78 in) W × 504 mm (19.84 in) D
Clampable/transportable board dimensions Thickness: 0.6 mm (0.02 in) to 3.2 mm (0.13 in)
  50 mm (1.97 in) W × 50 mm (1.97 in) H to 400 mm (15.75 in) × 330 mm (12.99 in) H 50 mm (1.97 in) W × 70 mm (2.76 in) H to 610 mm (24.02 in) × 510 mm (20.08 in) H
Power supply 200 V AC ±10% (single-phase), 50/60 Hz, 3 kVA
Dimensions and mass 1,500 mm (59.06 in) W × 1,800 mm (70.87 in) H × 860 mm (33.86 in) D, 1,000 kg (35,273.4 oz) 1,760 mm (69.29 in) W × 2,000 mm (78.74 in) H × 860 mm (33.86 in) D, 1,200 kg (42,328.0 oz)