X-Y BOARD HiTESTER 1270, 1271
Double-sided Board Tester with Maximum Measurement Speed of 0.015 s/step
Discontinued
The 1270 and 1271 are fixtureless, dual-sided, bare board testers that provide superior cost performance. Using a total of four arms, two in front and two in back, it is capable of simultaneously testing both sides of an optional board, and is available with a 4-terminal resistance measurement function that enables measurement of very small resistances in IVH or through holes.
Key Features
- Double-sided, simultaneous testing with a total of 4 arms (2 front, 2 back)
- Detection of invisible defects such as cracks thank to a pin low-resistance measurement function (optional feature)
- Extensive testing capabilities in addition to continuity testing and capacitance measurement (*1)
- High-speed testing at up to 0.012 sec./step while maintaining a high level of precision
- High resolution of 5 aF to ensure reliable detection of minute changes in capacitance caused by defects (1 aF = 10^-6 pF)
- Reliable probing of fine-pitch minute pads thanks to a minimum pad diameter of 20 μm
- Support for insulation dielectric strength testing with test voltages of up to 250 V (optional feature)
- High-speed soft landing function and shock-absorbing probes to minimize probe impact marks
- Automation of operations required in order to acquire test reference values and simple acquisition of basic data
- Short and break testing using the insulation and continuity testing method
- Short and break testing using the CR testing method
- Short and break testing using the capacitance measurement method
- Resistance testing of IVHs and through-holes (optional 4-terminal low-resistance measurement)
- Measurement of constants of embedded elements with L, C, R, and D measurement
*1:
Model No. (Order Code)
1270 | Discontinued, Board size : 50 × 50 to 400 × 330 mm |
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1271 | Discontinued, Board size : 50 × 70 to 610 × 510 mm |
Specifications overview
1270 | 1271 | |||||
Number of arms | 4 (2 front, 2 back) | |||||
Number of test steps | Max. 40,000 (during continuous testing, 300,000) | |||||
Measurement time | Max. 84 steps/sec. (0.1 mm movements, simultaneous probing with 4 arms, capacitance measurement) | |||||
Minimum pad diameter | φ 20 μm | |||||
Probe working area | 394 mm (15.51 in) W × 324 mm (12.76 in) D | 604 mm (23.78 in) W × 504 mm (19.84 in) D | ||||
Clampable/transportable board dimensions | Thickness: 0.6 mm (0.02 in) to 3.2 mm (0.13 in) | |||||
50 mm (1.97 in) W × 50 mm (1.97 in) H to 400 mm (15.75 in) × 330 mm (12.99 in) H | 50 mm (1.97 in) W × 70 mm (2.76 in) H to 610 mm (24.02 in) × 510 mm (20.08 in) H | |||||
Power supply | 200 V AC ±10% (single-phase), 50/60 Hz, 3 kVA | |||||
Dimensions and mass | 1,500 mm (59.06 in) W × 1,800 mm (70.87 in) H × 860 mm (33.86 in) D, 1,000 kg (35,273.4 oz) | 1,760 mm (69.29 in) W × 2,000 mm (78.74 in) H × 860 mm (33.86 in) D, 1,200 kg (42,328.0 oz) |