Bare Board Testing (flying probe tester)

• 4 arms (2 each, top and bottom), max. 100 points/sec
• 34 μm minimum pad pitch (with CP1075-09)
• 4 μm minimum pad size (with CP1075-09)

• Horizontal-loading double-sided flying probe bare board inspection tool
• Achieves both high-speed testing up to 100 points/sec. and improved probing accuracy

• 4 arms, max. 76 points/sec.
• Top surface: 32 um minimum pad pitch (with CP1075-09)
Bottom surface: 44 um minimum pad pitch (with CP1075-09)
• Top surface: 2 μm Minimum pad size (with CP1075-09)
Bottom surface: 14 μm Minimum pad size (with CP1075-09)

•Evaluating the reliability of high-density package boards
•Accurate contact with fine-pitch pads

• 2 arms, max. 100 points/sec
• 40 μm minimum pad pitch (with CP1075-09)
• 10 μm minimum pad size (with CP1075-09)

• Horizontal-loading single-sided flying probe bare board inspection tool
• High-speed pattern testing using the capacitive measurement method

• 4 arms, max. 67 points/sec.
• 45 μm minimum pad pitch (with CP1075-09)
• 15 μm Minimum pad size (with CP1075-09)

• Vertical double-sided flying probe tester for bare board inspections
• Open via defect detection with low resistance measurement
• Detect pattern shape abnormality and voids with super insulation resistance testing

• 2 arms, supports test fixture
• 10 μm × 10 μm probing precision
• 40 μm minimum pitch

• Flying probe test for package board testing
• Achieve both high precision contact and high-speed probing
• Double test method delivers an operation rate of 100%

• 3-in-1 for editing, test-point generation, and built-in component support
• New Windows-optimized algorithm
• Free from data volume restrictions for increased freedom
• Added new commands to reduce data generation time by half

• Gerber data editing software that embodies the know-how for substrate testing
• Reduce data generation time by 50% with new platform

• Dedicated visualization software for Hioki electrical testing equipment and data creation systems

• Pattern visualizing software for both ICT and bare board testers
• Search for components and nets on device embedded substrates