Application Software

• Detect significant points that can cause latent board defects
• Compatible with the FA1816, FA1817, FA1811, FA1812, etc.

• Detect latent defects with AI
• Data analysis utilizing high-precision measurement technology

• 3-in-1 for editing, test-point generation, and built-in component support
• New Windows-optimized algorithm
• Free from data volume restrictions for increased freedom
• Added new commands to reduce data generation time by half

• Gerber data editing software that embodies the know-how for substrate testing
• Reduce data generation time by 50% with new platform

• Dedicated visualization software for Hioki electrical testing equipment and data creation systems

• Pattern visualizing software for both ICT and bare board testers
• Search for components and nets on device embedded substrates

• Generate high-quality board testing data without physical boards

• Optimize testing performance when paired with the FA1240-50 Flying Probe Tester