FLYING PROBE TESTER FA1811
Meeting Ever Increasing Demands for Greater Analytical Power,
Faster Testing Speeds and Reduced Costs
Designed specifically for package board testing, the FA1811 achieves both high-precision contact with a total probing precision of 10 μm, and a testing speed rivaling generic flying probe testers to meet ever increasing demands for greater analytical power, faster testing speeds and reduced costs.
Key Features
- Achieve both high precision contact and high-speed probing in a space of 10 μm.
- Double test method delivers an operation rate of 100%.
- Full-net insulation continuity test using resistance: x10 max. speed*
- High-speed test using capacitance: x2 max. speed*
- *Compared to the double-sided 4-arm FLYING PROBE TESTER
Model No. (Order Code)
| FA1811 | 4096 channels built-in |
|---|
Specifications Overview
| Number of arms | 2 (Upper: 2) | |||||
|---|---|---|---|---|---|---|
| Mountable probes | CP1073 series | |||||
| Measurement parameters and measurement ranges | Resistance measurement : | 400.0 μΩ to 40.00 MΩ 4.000 Ω to 4.000 MΩ (T) |
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| Capacitance measurement : | 100.0 fF to 10.00 μF | |||||
| MLCC measurement : | 100.0 nF to 100.0 μF | |||||
| Insulation measurement : | 1.000 kΩ to 100.0 GΩ 1.000 kΩ to 250.0 MΩ (T) |
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| Capacitor insulation measurement : | 1.000 kΩ to 10.00 MΩ | |||||
| High-voltage resistance measurement : | 1.000 kΩ to 100.0 GΩ 1.000 kΩ to 250.0 MΩ (T) |
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| Leak current measurement : | 1.000 μA to 10.00 mA | |||||
| Continuity : | 400 mΩ to 1.000 kΩ | |||||
| Open measurement : | 4.000 Ω to 4.000 MΩ | |||||
| Short measurement : | 400.0 mΩ to 40.00 kΩ | |||||
| (T): When measuring via the TEST FIXTURE | ||||||
| Judgment range | -99.9% to +999.9% or absolute value | |||||
| Total probing precision | 10 μm (Square) | |||||
| Probing pitch | Min. 40 μm (when using CP1073-01) | |||||
| Supported range of board thicknesses for clamping | Follow option on BGA side | |||||
| Probing area | 75 mm (2.95 in) × 75 mm (2.95 in) | |||||
| Power supply | 200 V AC ±10% (three phase) 50/60 Hz (200 V, 220 V AC: specified upon order) Maximum power consumption: 5 kVA |
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| Dimensions and mass | 1300 mm (51.18 in) W × 1670 mm (65.75 in) H × 1700 mm (66.93 in) D (Excluding protruding parts), 2000 kg (70,546.7 oz) | |||||
TEST FIXTURE CP1165-11 Specifications
| Board dimensions | Square 10 mm (0.39 in) to Square 80 mm (3.15 in) | |||||
|---|---|---|---|---|---|---|
| Supported range of board thicknesses for clamping | 0.1 mm (0.004 in) to 5.0 mm (0.20 in) | |||||
| Notes | Designed for each board | |||||
| Board clamping | Holder, shutter, and vacuum pump required separately | |||||
| Supported pad diameter | 200 μm or larger, 300 μm or larger when using Kelvin probe | |||||
| Max. number of pins | 8192 | |||||
VACUUM UNIT FOR CAPACITANCE TEST E4101 Specifications
| Board dimensions | 50 mm (1.97 in) W × 90 mm (3.54 in) D to 105 mm (4.13 in) × 250 mm (9.84 in) | |||||
|---|---|---|---|---|---|---|
| Supported range of board thicknesses for clamping | 0.1 mm (0.004 in) to 0.8 mm (0.031 in) | |||||
| Notes | To accommodate the entire range of substrate thickness, it is necessary to replace the spacer for substrate thickness adjustment. | |||||
| Board clamping | VACUUM PUMP E4106 required separately | |||||
Utilities (0)
THERMAL MINI-PRINTER E4100
VACUUM UNIT FOR CAPACITANCE TEST E4101
EXPANSION IONIZER E4104
VACUUM PUMP E4106
GENERAL SCANNER BOARD E4511
TEST FIXTURE CP1165-11
SHUTTER E4107
FIXED HOLDER E4108
UNIVERSAL HOLDER E4109
Probes (0)
SINGLE PROBE CP1073-01
KELVIN PROBE CP1073-11
KELVIN PROBE CP1073-12
Testing data creation (3)
OFFLINE SOFTWARE E4110
Other (0)
MEASURING PART CALIBRATION UNIT 1330-05
CALIBRATION UNIT FOR MEASUREMENT SECTION E4501
RECORDING PAPER 1196
SHORT CIRCUIT BOARD FOR FLYING PROBE E4115
SHORT CIRCUIT BOARD FOR TEST FIXTURE E4116
CLEANING SHEET E4117
CLEANING BRUSH E4118
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Test Systems ATE Series Catalog
English
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Catalog: FLYING PROBE TESTER FA1811
English