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• 1 nΩ resolution for ultra-low resistance testing • Stable measurement during post-weld temperature changes (A-TC) • Offset control for temperature-sensitive environments (A-OVC) • Active protection against overvoltage inputs (ACP) • Maximum 9 Ω lead resistance tolerance for flexible system layout • For EV and ESS battery modules and pack manufacturing
• 0.1 μΩ to 120.0000 MΩ • 0.9 ms fastest measurement speed • Low-stress measurement for 0201-size ultra-small components
• For chip resistors and chip ferrite beads production • Equipped with ΔR function for visualizing process variations