Impedance Analyzers, up to 3 GHz

• |Z|, L, C, R testing
• 1MHz to 3GHz
• 0.5ms test speed, ±0.65% accuracy, 0.07% variability
• Measure LCR and conduct frequency sweeps simultaneously

• For R&D and high volume production of ferrite chip beads and chip inductors
• Comparator and Contact Check

• |Z|, L, C, R testing
• 100kHz to 300MHz
• 0.5ms test speed, ±0.72% accuracy
• Measure LCR and conduct frequency sweeps simultaneously

• For high volume production of ferrite chip beads and chip inductors
• Comparator and contact check

• |Z|, L, C, R testing
• 1MHz to 300MHz
• 0.5ms test speed, ±0.72% accuracy
• Measure LCR and conduct frequency sweeps simultaneously

• For high volume production inspections and research and development
• Comparator and contact check

• |Z|, L, C, R testing
• 1MHz to 600MHz
• 0.5ms test speed, ±0.65% accuracy
• Measure LCR and conduct frequency sweeps simultaneously

• For high volume production of ferrite chip beads and chip inductors
• Comprehensive contact check via DCR testing, Hi-Z reject or waveform judgment

• |Z|, L, C, R testing
• 1MHz to 1.3GHz
• 0.5ms test speed, ±0.65% accuracy, 0.07% variability
• Measure LCR and conduct frequency sweeps simultaneously

• For R&D and high volume production of ferrite chip beads and chip inductors
• Comparator and Contact Check

• |Z|, L, C, R, σ, ε testing
• Battery testing function
• 1 mHz to 200 kHz
• 2 ms test speed, ±0.05% accuracy

• For R&D of electrochemical components & materials, batteries, & EDLCs
• Measure ion behavior & solution resistance
• LCR impedance testing for Cole-Cole plots & equivalent-circuit analyses

• Optional software upgrade for Model IM3570
• 5 equivalent circuit models
• Compute ideal frequency characteristics and compare to measured values
• Cole-Cole plot, admittance circle display

• Conduct simple circuit analysis & detailed acceptance/rejection decision-making for impedance analysis of advanced electrochemical components

• |Z|, L, C, R testing
• 4 Hz to 5 MHz
• 0.5 ms test speed, ±0.08% accuracy
• Single device solution for high speed testing and frequency sweeping

• Superior low-impedance repeatability
• Meet applications in low-ESR measurement