Bare board/Package/Populated Board Testing

The Power to Connect

Continuing to create new solutions together

ATE Concept   The Power to Connect

Continuing to create new solutions together

Continuing to create new solutions together




Bare Board Testing (flying probe tester)

Bare Board Inspection Tool |FLYING PROBE TESTER FA1816


FLYING PROBE TESTER   FA1816

• Horizontal-loading single-sided flying probe bare board inspection tool
• High-speed pattern testing using the capacitive measurement method

Bare Board Inspection Tool |FLYING PROBE TESTER FA1816

• 2 arms, max. 100 points/sec • 16 μm × 16 μm probing precision • 50 μm minimum pitch

Double-sided Bare Board Inspection Tool | FLYING PROBE TESTER FA1817

FLYING PROBE TESTER   FA1817

• Vertical double-sided flying probe tester for bare board inspections
• Open via defect detection with low resistance measurement
• Detect pattern shape abnormality and voids with super insulation resistance testing

Double-sided Bare Board Inspection Tool | FLYING PROBE TESTER FA1817

• 4 arms, max. 67 points/sec. • 20 μm × 20 μm probing precision • 50 μm minimum pitch

FLYING PROBE TESTER FA1811

FLYING PROBE TESTER   FA1811

• Flying probe test for package board testing
• Achieve both high precision contact and high-speed probing
• Double test method delivers an operation rate of 100%

FLYING PROBE TESTER FA1811

• 2 arms, supports test fixture • 10 μm × 10 μm probing precision • 40 μm minimum pitch

FLYING PROBE TESTER  FA1283

FLYING PROBE TESTER   FA1283

• Horizontal-loading double-sided flying probe tester
• Inspection from general bare boards to fine and high density substrates such as flexible substrates and CSP

FLYING PROBE TESTER  FA1283

• 4 arms, max. 100 points/sec • Minimum 15 μm × 15 μm probing precision

Data Creation System for Bare Boards Testing | UA1781

FEB-LINE INSPECTION DATA CREATION SYSTEM   UA1781

• Gerber data editing software that embodies the know-how for substrate testing
• Reduce data generation time by 50% with new platform

Data Creation System for Bare Boards Testing | UA1781

• 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half

FAIL VISUALIZER UA1782

FAIL VISUALIZER   UA1782

• Pattern visualizing software for both ICT and bare board testers
• Search for components and nets on device embedded substrates

FAIL VISUALIZER UA1782

• Dedicated visualization software for Hioki electrical testing equipment and data creation systems



Bare Board Testing with test fixture

BARE BOARD TESTER 1232

BARE BOARD TESTER   1232

• High-precision batch fixture-type testing system that support boards with embedded passive and active devices

BARE BOARD TESTER 1232

• Double-sided alignment • 340 × 330 mm working area

Bare Board and Package Testing | BARE BOARD HiTESTER 1230

BARE BOARD HiTESTER   1230

• All-in-one solution for testing the reliability of connections on printed circuit boards

Bare Board and Package Testing | BARE BOARD HiTESTER 1230

• Emdedded passives/actives test • HDI via resistance • Known-good reference values for wiring pattern resistance



Populated Board Testing

Populated Board Testing | IN-CIRCUIT TESTER FA1220


IN-CIRCUIT TESTER   FA1220

• High-speed, multichannel testing of populated boards

Populated Board Testing | IN-CIRCUIT TESTER FA1220

• Extensive function testing • Macro-testing function to increase test efficiency • 4-wire resistance testing

Populated Board Testing | SHORT-OPEN TESTER FA1221


SHORT-OPEN TESTER   FA1221

• Multichannel short/open 4-wire test equipment for inspecting populated boards

Populated Board Testing | SHORT-OPEN TESTER FA1221

• Specifically designed for short/open testing • 4-wire resistance testing

FLYING PROBE TESTER FA1240,FA1241

FLYING PROBE TESTER   FA1240-6x

• High-speed 4-wire resistance testing of populated boards
• Quickly complete programs that take into account component height

FLYING PROBE TESTER FA1240,FA1241

• 4 arms, high-speed testing at up to 0.025 sec./step • 510 × 460 mm testing area • Automatic calculation of arm interference

Populated Board Testing | IN-CIRCUIT HiTESTER 1220

IN-CIRCUIT HiTESTER   1220

• High performance populated board tester with expansion capabilities

Populated Board Testing | IN-CIRCUIT HiTESTER 1220

• 4-wire resistance testing • High-current/high-voltage diode testing • High-speed testing of multi-board layouts



Application Software

Data Creation System for Bare Boards Testing | UA1781

FEB-LINE INSPECTION DATA CREATION SYSTEM   UA1781

• Gerber data editing software that embodies the know-how for substrate testing
• Reduce data generation time by 50% with new platform

Data Creation System for Bare Boards Testing | UA1781

• 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half

FAIL VISUALIZER UA1782

FAIL VISUALIZER   UA1782

• Pattern visualizing software for both ICT and bare board testers
• Search for components and nets on device embedded substrates

FAIL VISUALIZER UA1782

• Dedicated visualization software for Hioki electrical testing equipment and data creation systems

FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780

FIT-LINE INSPECTION DATA CREATION SYSTEM   UA1780

• Optimize testing performance when paired with the FA1240-50 Flying Probe Tester

FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780

• Generate high-quality board testing data without physical boards