Automatic Test Equipment (ATE)

The Power to Connect

Continuing to create new solutions together

A T E Concept   The Power to Connect

Continuing to create new solutions together

Continuing to create new solutions together




Bare Board Testing (flying probe tester)

FLYING PROBE TESTER FA1811


FLYING PROBE TESTER   FA1811

High precision contact
in a space of square 10 μm.

FLYING PROBE TESTER FA1811

• Achieve both high precision contact and high-speed probing. • Double test method delivers an operation rate of 100%.

FLYING PROBE TESTER  FA1283

FLYING PROBE TESTER   FA1283

Max.100 points/s ultra-high speed inspection
High-precision probing 15μm

FLYING PROBE TESTER  FA1283

• Max.100 points/s ultra-high speed inspection • High-precision probing 15μm

Data Creation System for Bare Boards Testing | UA1781

FEB-LINE INSPECTION DATA CREATION SYSTEM   UA1781

1/2 Data Generation Time With New Platform

Data Creation System for Bare Boards Testing | UA1781

• 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half

FLYING PROBE TESTER  FA1116-03

FLYING PROBE TESTER   FA1116

High-speed Testing at Up to 100 Points/sec. with Half the Impact Mark Depth

FLYING PROBE TESTER  FA1116-03

• Reduced-impact link probes CP1072-01(option) • Laser height-adjustment Unit FA1950-06(option) • Reduced fine pattern test times • High-speed pattern testing using capacitance measurement

FAIL VISUALIZER UA1782

FAIL VISUALIZER   UA1782

Robust Support for Repair Work Using Simple Operations and Assistive Functionality

FAIL VISUALIZER UA1782

• Dedicated visualization software for Hioki electrical testing equipment and data creation systems

Bare Board and Package Testing | X-Y BOARD HiTESTER 1270,1271

X-Y BOARD HiTESTER   1270, 1271

Double-sided, 4 arms testing
Low-resistance measurement (option)

Bare Board and Package Testing | X-Y BOARD HiTESTER 1270,1271

• Double-sided, 4 arms testing • Low-resistance measurement function (option)



Bare Board Testing with test fixture

BARE BOARD TESTER 1232

BARE BOARD TESTER   1232

High-Precision Batch Fixture-Type Testing System that Support Boards with Embedded Passive and Active Devices

BARE BOARD TESTER 1232

• Double-sided alignment • 340 × 330 mm working area

Bare Board and Package Testing | BARE BOARD HiTESTER 1230

BARE BOARD HiTESTER   1230

All-In-One Solution for Testing the Reliability of Connections on Printed Circuit Boards

Bare Board and Package Testing | BARE BOARD HiTESTER 1230

•Emdedded passives/actives test •HDI via resistance •Known-good reference values for wiring pattern resistance



Populated Board Testing

FLYING PROBE TESTER FA1240,FA1241


FLYING PROBE TESTER   FA1240-6x

4-terminal testing
high-speed

FLYING PROBE TESTER FA1240,FA1241

• Quickly complete programs that take into account component height • Automatic calculation of arm interference

FAIL VISUALIZER UA1782

FAIL VISUALIZER   UA1782

Robust Support for Repair Work Using Simple Operations and Assistive Functionality

FAIL VISUALIZER UA1782

• Dedicated visualization software for Hioki electrical testing equipment and data creation systems

FLYING PROBE TESTER FA1240,FA1241

FLYING PROBE TESTER   FA1240-5x

4-terminal testing

FLYING PROBE TESTER FA1240,FA1241

• Quickly complete programs that take into account component height • Automatic calculation of arm interference

Populated Board Testing | IN-CIRCUIT HiTESTER 1220

IN-CIRCUIT HiTESTER   1220

High Performance Populated Board Testing with Expansion Capabilities

Populated Board Testing | IN-CIRCUIT HiTESTER 1220

• 4-terminal testing • High-current/high-voltage diode testing • High-speed testing of multi-board layouts



Data Creation Software

Data Creation System for Bare Boards Testing | UA1781

FEB-LINE INSPECTION DATA CREATION SYSTEM   UA1781

1/2 Data Generation Time With New Platform

Data Creation System for Bare Boards Testing | UA1781

• 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half

FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780

FIT-LINE INSPECTION DATA CREATION SYSTEM   UA1780

90% Faster Data Generation, 93% Lower Line Stoppage Times

FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780

• Generate high-quality board testing data without physical boards