Test fixture or Probes

• Test fixture for IMPEDANCE ANALYZER IM7580 series
• High frequency testing up to 600 MHz
• Properly identify SRF and ESR to validate component performance

Flexible Staging Mechanism Supports a Diverse Range of Component Shapes and Sizes

• For direct connection two-wire testing
• DC to 3 GHz
• 6 measurable sample sizes: 0201 to 1210 (inch)

• Test fixture for IM7580 series Impedance Analyzers
• High frequency analysis

• For direct connection two-wire testing
• DC to 1 MHz
• Measurable sample size: 008004 (inch)

• High-precision two-wire fixture
• High reproducibility with advanced contact technology

• Direct-connection testing
• Test SMDs with electrodes on the bottom
• DC to 8MHz（Can be measured up to 10 MHz, when combined with the special order model IM3536-01）
• Measurable sample sizes: Metric (Inch): 0402 (01005), 0603 (0201), 1005 (0402)

• High-precision 4-wire testing of advanced electronic components

• DC to 8MHz, 50Ω termination
• Tip electrode spacing: 0.3 to 6 mm
• Measurable sample sizes: 0201 to 2220 (inch)

• 2-wire probe for LCR testing of small chip components