Hioki Launches Next-Generation CT6704 and CT6705 Current Probes for High-Frequency, Large-Current Measurement
Jun. 18, 2026
Product
Double Pulse Testing of SiC/GaN device
Measurement Error Factors in Reactor Loss Measurement and Key Considerations for High-Accuracy Measurement
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Firmware
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Power Analyzer PW4001 |
V1.10 |
| Jun. 10, 2026 |
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Firmware
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IEC Harmonic/Flicker Measurement PW9006 |
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| Jun. 10, 2026 |
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Firmware
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Version Upgrade for SM7110, SM7120 |
Main V1.14、Sub V2.03 / Main V2.14、Sub V3.02 |
| Jun. 08, 2026 |
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Hioki Launches IEC 61000-4-7 and IEC 61000-4-15 Compliant Harmonics/Flicker Measurement Optional License for PW4001 Power Analyzer
Jun. 10, 2026
Product
Eliminate False PASS in Battery Module and Battery Pack DC Hipot Tests
Insulation Failure “Visualization” for More Efficient Battery Hipot Testing
