New Products

GENNECT CROSS   SF4000

Display acquired data as graphs in real-time
Windows compatible

• Software automatically recognizes LAN-connected measuring instrument • Display acquired data as graphs in real-time • Windows compatible


SWITCH MAINFRAME   SW1001

Pair with a measuring instrument to achieve
up to 66 channels of testing

• Pair with a measuring instrument to achieve multi-channel capabilities • Max. 66 channels (2-wire) to max. 18 channels (4-terminal pair)


SWITCH MAINFRAME   SW1002

Pair with a measuring instrument to achieve
up to 264 channels of testing

• Pair with a measuring instrument to achieve multi-channel capabilities • Max. 264 channels (2-wire) to max. 72 channels (4-terminal pair)


POWER SOURCE UNIT   SM7860

Up to 32 ch voltage output
50 mA per channel output

• Specially designed power source unit for the SM7810 • 32 ch, ±500 V to ±1000 V • 50 mA per channel output


BATTERY HiTESTER   BT3564

EV and PHEV battery pack testing
Max. applied voltage: 1000 VDC

• EV and PHEV battery pack testing • Pack total resistance, bus bar resistance • Testing source: AC 1kHz • Measure voltage up to 1000V


AC CLAMP METER   CM3289

42 to 1000 A AC range
100 g/16 mm

• Get into even more confined spaces • 42 to 1000 A AC range • DMM function


MEMORY HiCORDER   MR6000

Max. 32ch Analog to 128ch Logic
Max. 200M-Sampling/s (16ch)

 

• Max. 32ch Analog to 128ch Logic • 200M-Sampling/s (16ch) • 1G-Word Memory (1ch)


AC/DC CURRENT SENSOR   CT6904

DC to 4 MHz
Rated 500A AC/DC

 

• DC to 4 MHz (Phase: up to 1 MHz) • Rated 500A AC/DC • φ 32 mm (1.26 in) core dia.


HEAT FLOW SENSOR   Z2012-01 to Z2017-01

K thermocouple and
heat flow sensor in one device

 

・K thermocouple and heat flow sensor in one device ・Flexible sensor that can measure curved surfaces


LUX METER   FT3425

DIN 5032-7:1985 class B
0 to 200,000 lx

• DIN 5032-7:1985 class B • 0 to 200,000 lx • Memory function • Built-in Bluetooth® wireless technology


BARE BOARD TESTER   FA1232

Robust Support for Testing Device Embedded Substrates

• Double-sided bare board testing