NEW

FLYING PROBE TESTER

FA1817

Detecting Latent Failures in High Density Substrates Without Fail

The FA1817 is a fixtureless, dual-sided, bare board tester that provides superior cost performance and quick inspection yield thanks to advanced probe movement technology.  Using a total of four arms, two in front and two in back, it is capable of simultaneously testing both sides of the board, provides open via detection via low resistance testing. Key Features • Optimization of probe movement reduces inspection time by up to 20% • Reduce dents in combination with the latest probes • Fault analysis using newly developed “Process Analyzer” • Substrate set: Vertical direction • Arm configuration: 2 Table, 2 Back (4 arms) • Maximum board size: 610 mm (24.02 in) × 510 mm (20.08 in)

Model No. (Order Code)

FA1817 Vertical double sided

Installation area: FA1817 can inspect boards (610 × 510 mm) of the same size as the conventional Model 1271, but the installation area for the equipment is even smaller than the conventional Model 1270 (inspection board size is smaller than on the 1271), contributing to space saving measures. In addition, a back door is available as an option, supporting easier maintenance.

Specifications Overview

Number of arms4 (2 Table, 2 Back)
Mountable probes1172 series, CP1072 series
Inspectable substrateStandard specification: 50 mm (1.97 in) W × 50 mm (1.97 in) H to 610 mm (24.02 in) W × 510 mm (20.08 in) H, Thickness 1.0 mm (0.04 in) to 3.2 mm (0.13 in)
Fixed air type board (option): 50 mm (1.97 in) W × 70 mm (2.76 in) H to 610 mm (24.02 in) W × 510 mm (20.08 in) H, Thickness: 0.6 mm (0.02 in) to 6.0 mm (0.24 in)
Maximum inspectable area604 mm (23.78 in) W × 504 mm (19.84 in) H
Total probing precision25 μm (Square), (Note: Restrictions on inspection conditions)
Probing pitchMin. 50 μm (When using CP1072-01 probe, between L-R arm)
Measurement rangesDC constant current conduction measurement: 400.0 μΩ to 400.0 kΩ
DC constant current resistance measurement: 40.00 μΩ to 400.0 kΩ
DC constant voltage resistance measurement: 4.000 Ω to 40.00 MΩ
Insulation resistance measurement: 1.000 kΩ to 100.0 GΩ
AC constant voltage capacitance measurement: 100.0 fF to 10.00 μF
Insulation resistance measurement: 1.000 kΩ to 100.0 GΩ
Leak current measurement: 1.000 μA to 10.00 mA
High voltage resistance measurement: 1.000 kΩ to 100.0 GΩ
Capacitor insulation measurement: 1.000 kΩ to 10.00 MΩ
Open measurement: 4.000 Ω to 4.000 MΩ
Short measurement: 400.0 mΩ to 40.00 kΩ
Judgment range-99.9% to +999.9% or absolute value
Measurement timeMax. 0.015 sec / step (when 0.15 mm movement · 4-arm simultaneous probing, capacity measurement)
Power supply200 VAC, 220 VAC, 230 VAC, 240 VAC single phase (specify upon order), 50/60 Hz, Maximum power consumption: 3 kVA
Dimensions and mass1500 mm (59.06 in) W × 1950 mm (76.77 in) H × 800 mm (31.50 in) D, 1000 kg (35,273.4 oz)

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Seminar Videos On Demand

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Seminar Schedule

Registration Open

Nepcon South China 2019 - Shenzhen, China

Aug 28, 2019 - Aug 30, 2019

Registration Open

Electronics Manufacturing Korea 2019 - Seoul, Korea

May 15, 2019 - May 17, 2019

Catalogs

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User Guides

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Manuals

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Outline Drawings

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Technical Notes

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Declaration of Conformity

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Drivers, Firmware

Process Analyzer  Software V1.00.0 

Others

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Applications

Gallery

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