FLYING PROBE TESTER

FA1811

Meeting Ever Increasing Demands for Greater Analytical Power, Faster Testing Speeds and Reduced Costs

Designed specifically for package board testing, the FA1811 achieves both high-precision contact with a total probing precision of 10 μm, and a testing speed rivaling generic flying probe testers to meet ever increasing demands for greater analytical power, faster testing speeds and reduced costs. Key Features • Achieve both high precision contact and high-speed probing in a space of 10 μm. • Double test method delivers an operation rate of 100%. • Full-net insulation continuity test using resistance: x10 max. speed* • High-speed test using capacitance: x2 max. speed* (* Compared to the double-sided 4-arm FLYING PROBE TESTER)

Model No. (Order Code)

FA1811 4096 channels built-in

Testing requires either the CP1165-11 or the E4101.

NotCE

Specifications Overview

Number of arms2 (Upper: 2)
Mountable probesCP1073 series
Measurement parameters and measurement rangesResistance measurement : 400.0 μΩ to 40.00 MΩ
4.000 Ω to 4.000 MΩ (T)
Capacitance measurement : 100.0 fF to 10.00 μF
MLCC measurement : 100.0 nF to 100.0 μF
Insulation measurement : 1.000 kΩ to 100.0 GΩ
1.000 kΩ to 250.0 MΩ (T)
Capacitor insulation measurement : 1.000 kΩ to 10.00 MΩ
High-voltage resistance measurement : 1.000 kΩ to 100.0 GΩ
1.000 kΩ to 250.0 MΩ (T)
Leak current measurement : 1.000 μA to 10.00 mA
Continuity : 400 mΩ to 1.000 kΩ
Open measurement : 4.000 Ω to 4.000 MΩ
Short measurement : 400.0 mΩ to 40.00 kΩ
(T): When measuring via the TEST FIXTURE
Judgment range-99.9% to +999.9% or absolute value
Total probing precision10 μm (Square)
Probing pitchMin. 40 μm (when using CP1073-01)
Supported range of board thicknesses for clampingFollow option on BGA side
Probing area75 mm (2.95 in) × 75 mm (2.95 in)
Power supply200 V AC ±10% (three phase) 50/60 Hz (200 V, 220 V AC: specified upon order)
Maximum power consumption: 5 kVA
Dimensions and mass1300 mm (51.18 in) W × 1670 mm (65.75 in) H × 1700 mm (66.93 in) D (Excluding protruding parts), 2000 kg (70,546.7 oz)

TEST FIXTURE CP1165-11 Specifications

Board dimensionsSquare 10 mm (0.39 in) to Square 80 mm (3.15 in)
Supported range of board thicknesses for clamping0.1 mm (0.004 in) to 5.0 mm (0.20 in)
NotesDesigned for each board
Board clampingHolder, shutter, and vacuum pump required separately
Supported pad diameter200 μm or larger, 300 μm or larger when using Kelvin probe
Max. number of pins8192

VACUUM UNIT FOR CAPACITANCE TEST E4101 Specifications

Board dimensions50 mm (1.97 in) W × 90 mm (3.54 in) D to 105 mm (4.13 in) × 250 mm (9.84 in)
Supported range of board thicknesses for clamping0.1 mm (0.004 in) to 0.8 mm (0.031 in)
NotesTo accommodate the entire range of substrate thickness, it is necessary to replace the spacer for substrate thickness adjustment.
Board clampingVACUUM PUMP E4106 required separately

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Seminar Videos On Demand

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Seminar Schedule

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Catalogs

Catalog: FLYING PROBE TESTER FA1811 Download PDF  [1MB] English

User Guides

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Manuals

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Outline Drawings

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Technical Notes

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Declaration of Conformity

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Drivers, Firmware

Process Analyzer  Freeware V1.02.0 

Others

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Options

Utilities

THERMAL MINI-PRINTER E4100
VACUUM UNIT FOR CAPACITANCE TEST E4101
EXPANSION IONIZER E4104
VACUUM PUMP E4106
GENERAL SCANNER BOARD E4511
TEST FIXTURE CP1165-11
SHUTTER E4107
FIXED HOLDER E4108
UNIVERSAL HOLDER E4109

Probes

SINGLE PROBE CP1073-01
KELVIN PROBE CP1073-11
KELVIN PROBE CP1073-12

Testing data creation

OFFLINE SOFTWARE E4110
FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781
FAIL VISUALIZER UA1782
FAIL VISUALIZER UA1782-01

Other

MEASURING PART CALIBRATION UNIT 1330-05
CALIBRATION UNIT FOR MEASUREMENT SECTION E4501
RECORDING PAPER 1196
SHORT CIRCUIT BOARD FOR FLYING PROBE E4115
SHORT CIRCUIT BOARD FOR TEST FIXTURE E4116
CLEANING SHEET E4117
CLEANING BRUSH E4118

Applications

Gallery

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