FLYING PROBE TESTER

FA1240-6x

Flying Probe In-circuit Tester

Key Features • Quickly complete programs that take into account component height • Automatic calculation of arm interference (when used with the UA1780) • Designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement. • High-speed testing at up to 0.025 sec./step • Detection of IC lead float and pseudo-contact states • Support for active testing (optional feature) • High-precision probing • Large testing area of 510 × 460 mm (FA1240-61) • Standard transport capability • Automatic alignment function and simple visual test function CE Compliant model: FA1241-61

Model No. (Order Code)

FA1240-61 For large boards
FA1240-63 For medium rack boards
FA1241-61 CE compliant model, for large boards

CE
Compliant FA1241-61

Specifications Overview

FA1240-61
FA1241-61
FA1240-63
Number of arms4 (L, ML, MR, R)
Number of test steps40,000 (max.)
Measurement rangesResistance: 400 μΩ to 40 MΩ
Capacitance: 1 pF to 400 mF
Inductance: 1 μH to 100 H
Diode VZ measurement: 0 to 25 V
Zener diode VZ measurement: 0 to 25 V, 25 to 80 V (optional feature)
Digital transistors: 0 to 25 V
Photo couplers: 0 to 25 V
Short: 0.4 Ω to 400 kΩ
Open: 4 Ω to 40 MΩ
DC voltage measurement: 0 to 25 V
Measurement timeMax. 0.025 sec./stepMax. 0.025 sec./step
Probing precisionWithin ±100 μm for each arm (X and Y directions)
Positioning repeatabilityWithin ±50 μm (probing positions)
Inter-probe pitchMin. 0.15 mm
Min. 0.5 mm (when using 4-terminal probes)
Min. 0.15 mm
Min. 0.5 mm (when using 4-terminal probes)
Testable board dimensions510 mm (20.08 in) W × 460 mm (18.11 in) D400 mm (15.75 in) W × 330 mm (12.99 in) D
Power supply200 V AC (single-phase), 50/60 Hz, 6 kVA (FA1241: 230 V AC)200 V AC (single-phase), 50/60 Hz,
5 kVA
Dimensions and mass1406 mm (55.35 in) H × 1300 mm (51.18 in) H × 1380 mm (54.33 in) D, 1150 kg (40,564.4 oz)1266 mm (49.84 in) H × 1369 mm (53.90 in) H × 1425 mm (56.10 in) D, 1050 kg (37,037 oz)

Hioki offers members manuals and other technical documentation.
The documents are available for download on your myHIOKI page.

Catalogs

FLYING PROBE TESTER FA1240 Download PDF  [2MB] English

User Guides

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Manuals

Outline Drawings

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Technical Notes

Declaration of Conformity

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Drivers, Firmware

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Others

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Options

Options

FIT-LINE INSPECTION DATA CREATION SYSTEM

FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780

• Generate high-quality board testing data without physical boards

Learn more

Applications

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Gallery

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