LCR Testers -HIOKI PRODUCTS-

Component Measuring < Products

		Component Testing Instruments Index

	All information correct as of November 1, 2002. All specifications are subject to change without notice.

		Discontinued Products

				Inductance, Capacitance, Impedance measurement

LCR HiTESTER
3535

	\|Z\|, L, C, R testing
	Testing source frequency: 100kHz to 120MHz
	Measuring time: 6msec

LCR HiTESTER
3532-50

	\|Z\|, L, C, R testing
	Testing source frequency: 42Hz to 5MHz
	Measuring time: 5msec

LCR HiTESTER
3522-50

	\|Z\|, L, C, R testing
	Testing source frequency: DC, 1mHz to 100kHz
	Measuring time: 5msec

LCR HiTESTER
3511-50

	\|Z\|, L, C, R testing
	Testing source frequency: 120Hz or 1kHz
	Measuring time: 5msec

				Capacitance measurement for production lines

C HiTESTER
3506

	C, D (tan δ), Q testing
	Measure low capacitance
	Testing source frequency: 1kHz, 1MHz
	Measuring time: 2msec
	RS-232C, GP-IB

C HiTESTER
3505

	C, D (tan δ), Q testing
	Measure low capacitance
	Testing source frequency: 1kHz, 100kHz, 1MHz
	Measuring time: 2msec
	RS-232C, GP-IB

C HiTESTER
3504-60

	C, D (tan δ) testing
	Measure high capacitance MLCC
	BIN function
	Contact check function
	Testing source frequency: 120Hz or 1kHz
	Measuring time: 2msec
	RS-232C, GP-IB

C HiTESTER
3504-50

	C, D (tan δ) testing
	Measure high capacitance MLCC
	BIN function
	Testing source frequency: 120Hz or 1kHz
	Measuring time: 2msec
	RS-232C, GP-IB

C HiTESTER
3504-40

	C, D (tan δ) testing
	Measure high capacitance MLCC
	Testing source frequency: 120Hz or 1kHz
	Measuring time: 2msec
	RS-232C

CAPACITANCE HiTESTER 3501

	C testing only
	Testing source signal: 4V DC
	Recharge time measurement method
	Analog meter type

See all HIOKI Component Measuring Instruments