 |
|
Component Testing Instruments Index |
|
|
All information correct as of November 1, 2002. All specifications are subject to change without notice. |
|
|
|
|
|
Milliohm Testers and High-precision DMMs - For low resistance measurement |
|
|
|
 |
 |
Testing source DC |
|
100 ms response |
|
16 times/sec. sampling |
|
Comparator (buzzer only)
|
|
|
|
|
|
 |
|
Wide measurement range |
|
0.1µΩ(20m Ωrange) to 110MΩ |
|
High speed and High precision
|
|
|
|
|
|
 |
|
Testing source AC 1kHz |
|
50/60 times/sec. sampling |
|
Comparator output, full |
|
remote control, RS-232C |
|
included GP-IB or Printer |
|
interface optiononly |
|
|
|
|
|
 |
|
Prints out measurement |
|
data at fixed intervals |
|
for 3227, 3540, 3560, 3550, 3551
|
|
|
|
|
|
 |
|
Multi-function and high-accuracy type |
|
199,999 count display |
|
High-speed sampling |
|
True RMS rectifier |
|
|
|
|
|
|
 |
|
For compact storage batteries: portable |
|
telephones and similar applications |
|
Check battery deterioration |
|
|
|
|
|
 |
|
The Perfect Battery Tester for the Production Line |
|
Testing source AC 1kHz |
|
EXT I/O, RS-232C, GP-IB
|
|
|
|
|
|
 |
|
Auto-hold and auto-data storage |
|
batteries: UPS and similar applications |
|
Store up to 4800 sets of data
|
|
|
|
|
|
|
|
|
Inductance, Capacitance, Impedance measurement |
|
|
|
 |
|
|Z|, L, C, R testing |
|
Testing source frequency: 100kHz to 120MHz |
|
Measuring time: 6msec |
|
|
|
|
|
 |
|
|Z|, L, C, R testing |
|
Testing source frequency: 42Hz to 5MHz |
|
Measuring time: 5msec |
|
|
|
|
|
 |
|
|Z|, L, C, R testing |
|
Testing source frequency: DC, 1mHz to 100kHz |
|
Measuring time: 5msec |
|
|
|
|
|
 |
|
|Z|, L, C, R testing |
|
Testing source frequency: 120Hz or 1kHz |
|
Measuring time: 5msec |
|
|
|
|
|
|
|
Capacitance measurement for production lines |
|
|
|
 |
|
C, D (tan δ), Q testing |
|
Measure low capacitance |
|
Testing source frequency: 1kHz, 1MHz |
|
Measuring time: 2msec |
|
RS-232C, GP-IB
|
|
|
|
|
|
 |
|
C, D (tan δ), Q testing |
|
Measure low capacitance |
|
Testing source frequency: 1kHz, 100kHz, 1MHz |
|
Measuring time: 2msec |
|
RS-232C, GP-IB
|
|
|
|
|
|
 |
|
C, D (tan δ) testing |
|
Measure high capacitance MLCC |
|
BIN function |
|
Contact check function |
|
Testing source frequency: 120Hz or 1kHz |
|
Measuring time: 2msec |
|
RS-232C, GP-IB |
|
|
|
|
|
 |
|
C, D (tan δ) testing |
|
Measure high capacitance MLCC |
|
BIN function |
|
Testing source frequency: 120Hz or 1kHz |
|
Measuring time: 2msec |
|
RS-232C, GP-IB
|
|
|
|
|
|
 |
|
C, D (tan δ) testing |
|
Measure high capacitance MLCC |
|
Testing source frequency: 120Hz or 1kHz |
|
Measuring time: 2msec |
|
RS-232C |
|
|
|
|
|
 |
|
C testing only |
|
Testing source signal: 4V DC |
|
Recharge time measurement method |
|
Analog meter type
|
|
|
|
|
|
