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Component Measuring < Products

Component Testing Instruments Index
All information correct as of November 1, 2002. All specifications are subject to change without notice.
Discontinued Products  New
Inductance, Capacitance, Impedance measurement
IMPEDANCE ANALYZER IM3570 EQUIVALENT CIRCUIT ANALYSIS FIRMWARE IM9000 LCR HiTESTER 3535 LCR HiTESTER 3532-50 LCR HiTESTER 3522-50
IMPEDANCE ANALYZER IM3570
  • |Z|, L, C, R testing
  • Testing source frequency: 4 Hz to 5 MHz
  • Measuring time: 0.5 msec
  • Measure LCR and conduct frequency sweeps simultaneously
EQUIVALENT CIRCUIT ANALYSIS FIRMWARE IM9000
  • Optional software built in to the IM3570
  • Equivalent five circuit models
  • Enables displaying the ideal frequency characteristics graph derived from the analysis results
  • Cole-Cole plot, Admittance circle display
LCR HiTESTER 3535
  • |Z|, L, C, R testing
  • Testing source frequency: 100kHz to 120MHz
  • Measuring time: 6msec
LCR HiTESTER 3532-50
  • |Z|, L, C, R testing
  • Testing source frequency: 42Hz to 5MHz
  • Measuring time: 5msec
LCR HiTESTER 3522-50
  • |Z|, L, C, R testing
  • Testing source frequency: DC, 1mHz to 100kHz
  • Measuring time: 5msec
LCR HiTESTER 3511-50
LCR HiTESTER 3511-50
  • |Z|, L, C, R testing
  • Testing source frequency: 120Hz or 1kHz
  • Measuring time: 5msec
Capacitance measurement for production lines
C HiTESTER 3506 C HiTESTER 3505 C HiTESTER 3504-60 C HiTESTER 3504-50 C HiTESTER 3504-40
C HiTESTER 3506
  • C, D (tan δ), Q testing
  • Measure low capacitance
  • Testing source frequency: 1kHz, 1MHz
  • Measuring time: 2msec
  • RS-232C, GP-IB
C HiTESTER 3505
  • C, D (tan δ), Q testing
  • Measure low capacitance
  • Testing source frequency: 1kHz, 100kHz, 1MHz
  • Measuring time: 2msec
  • RS-232C, GP-IB
C HiTESTER 3504-60
  • C, D (tan δ) testing
  • Measure high capacitance MLCC
  • BIN function
  • Contact check function
  • Testing source frequency: 120Hz or 1kHz
  • Measuring time: 2msec
  • RS-232C, GP-IB
C HiTESTER 3504-50
  • C, D (tan δ) testing
  • Measure high capacitance MLCC
  • BIN function
  • Testing source frequency: 120Hz or 1kHz
  • Measuring time: 2msec
  • RS-232C, GP-IB
C HiTESTER 3504-40
  • C, D (tan δ) testing
  • Measure high capacitance MLCC
  • Testing source frequency: 120Hz or 1kHz
  • Measuring time: 2msec
  • RS-232C
Battery Testers
BATTERY HiTESTER BT3563 BATTERY HiTESTER BT3562 BATTERY HiTESTER 3561 BATTERY HiTESTER 3555 BATTERY HiTESTER 3554
BATTERY HiTESTER BT3563
  • The Perfect Battery Tester for the Production Line
  • Testing source AC 1kHz
  • Measure of High-voltage Battery Packs up to 300V
  • Measurement time: 18ms
  • Finest resolution 0.1μΩ and 10μV
BATTERY HiTESTER BT3562
  • The Perfect Battery Tester for the Production Line
  • Testing source AC 1kHz
  • Measure of High-voltage Battery Packs up to 60V
  • Measurement time: 18ms
  • Finest resolution 0.1μΩ and 10μV
BATTERY HiTESTER 3561
  • The Perfect Battery Tester for the small secondary batteris
  • Testing source AC 1kHz
  • Measurement time: 10ms
  • Finest resolution 0.01mΩ
BATTERY HiTESTER 3555
  • For compact secondary batteries: check battery deterioration
  • Testing source AC 1kHz
  • Finest resolution 100μΩ
BATTERY HiTESTER 3554
  • For compact secondary batteries or up to large lead type, to check battery deterioration
  • Testing source AC 1kHz
  • Finest resolution 1μΩ
Bench type DMMs for production line (Digital Multi Meter)
DIGITAL HiTESTER 3239, 3239-01 DIGITAL HiTESTER 3238, 3238-01 DIGITAL HiTESTER 3237, 3237-01
DIGITAL HiTESTER 3239, 3239-01
  • 4-terminal resistance measurement
  • Multi functional/high precision 5-1/2 digits
  • 300 times/s sampling
  • Comparator
  • External control I/O
DIGITAL HiTESTER 3238, 3238-01
  • Multi functional/high precision 5-1/2 digits
  • 300 times/s sampling
  • Comparator
  • External control I/O
DIGITAL HiTESTER 3237, 3237-01
  • Simple & Low cost type
  • High precision 5-1/2 digits
  • 300 times/s sampling
  • Comparator
  • External control I/O
For resistance measurement
RESISTANCE HiTESTER RM3543 RESISTANCE HiTESTER RM3542 RESISTANCE HiTESTER 3541 mΩ HiTESTER 3540 DIGITAL PRINTER 9203
RESISTANCE HiTESTER RM3543
  • Advanced Enough to Measure 0.1 mΩ Shunts with Room to Spare
  • Ideal high precision & high resolution for automated lines
  • Testing source: DC
  • Minimum integration time: 0.1 ms
  • Finest resolution: 0.01 μΩ
RESISTANCE HiTESTER RM3542
  • Ideal high speed resistance meter for automated lines
  • Testing source:DC
  • Fastest measurement time:0.9ms
  • Minimum integration time:0.1ms
  • Finest resolution:0.1μΩ
RESISTANCE HiTESTER 3541
  • For coil up or line resistance measurement to high resistance measurement
  • Testing source:DC
  • Minimum response time:a few ms
  • Sampling rate: 0.6ms ±0.3ms
  • Finest resolution:0.1μΩ
mΩ HiTESTER 3540
  • For coil up or line resistance measurement
  • Testing source:DC
  • Minimum response time:100ms
  • Sampling speed: 16times/sec.
  • Finest resolution:10μΩ
DIGITAL PRINTER 9203
  • Prints out measurement data at fixed intervals
  • for 3227, 3540, 3560, 3550, 3551