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Component Measuring < Products

Component Testing Instruments Index
All information correct as of November 1, 2002. All specifications are subject to change without notice.
Discontinued Products  New
Inductance, Capacitance, Impedance measurement
IMPEDANCE ANALYZER IM3570 LCR HiTESTER 3535 LCR HiTESTER 3532-50 LCR HiTESTER 3522-50 LCR HiTESTER 3511-50
IMPEDANCE ANALYZER IM3570
  • |Z|, L, C, R testing
  • Testing source frequency: 4 Hz to 5 MHz
  • Measuring time: 0.5 msec
  • Measure LCR and conduct frequency sweeps simultaneously
LCR HiTESTER 3535
  • |Z|, L, C, R testing
  • Testing source frequency: 100kHz to 120MHz
  • Measuring time: 6msec
LCR HiTESTER 3532-50
  • |Z|, L, C, R testing
  • Testing source frequency: 42Hz to 5MHz
  • Measuring time: 5msec
LCR HiTESTER 3522-50
  • |Z|, L, C, R testing
  • Testing source frequency: DC, 1mHz to 100kHz
  • Measuring time: 5msec
LCR HiTESTER 3511-50
  • |Z|, L, C, R testing
  • Testing source frequency: 120Hz or 1kHz
  • Measuring time: 5msec
Capacitance measurement for production lines
C HiTESTER 3506 C HiTESTER 3505 C HiTESTER 3504-60 C HiTESTER 3504-50 C HiTESTER 3504-40
C HiTESTER 3506
  • C, D (tan δ), Q testing
  • Measure low capacitance
  • Testing source frequency: 1kHz, 1MHz
  • Measuring time: 2msec
  • RS-232C, GP-IB
C HiTESTER 3505
  • C, D (tan δ), Q testing
  • Measure low capacitance
  • Testing source frequency: 1kHz, 100kHz, 1MHz
  • Measuring time: 2msec
  • RS-232C, GP-IB
C HiTESTER 3504-60
  • C, D (tan δ) testing
  • Measure high capacitance MLCC
  • BIN function
  • Contact check function
  • Testing source frequency: 120Hz or 1kHz
  • Measuring time: 2msec
  • RS-232C, GP-IB
C HiTESTER 3504-50
  • C, D (tan δ) testing
  • Measure high capacitance MLCC
  • BIN function
  • Testing source frequency: 120Hz or 1kHz
  • Measuring time: 2msec
  • RS-232C, GP-IB
C HiTESTER 3504-40
  • C, D (tan δ) testing
  • Measure high capacitance MLCC
  • Testing source frequency: 120Hz or 1kHz
  • Measuring time: 2msec
  • RS-232C
CAPACITANCE HiTESTER 3501
CAPACITANCE HiTESTER 3501
  • C testing only
  • Testing source signal: 4V DC
  • Recharge time measurement method
  • Analog meter type
For low resistance measurement
(Model 3560 recommended for contact resistance testing)
RESISTANCE HiTESTER RM3542, RM3542-01 RESISTANCE HiTESTER 3541 mΩ HiTESTER 3540 AC mΩ HiTESTER 3560 DIGITAL PRINTER 9203
RESISTANCE HiTESTER 3541
  • Ideal high speed resistance meter for automated lines
  • Testing source:DC
  • Fastest measurement time:0.9ms
  • Minimum integration time:0.1ms
  • Finest resolution:0.1μΩ
RESISTANCE HiTESTER 3541
  • For coil up or line resistance measurement to high resistance measurement
  • Testing source:DC
  • Minimum response time:a few ms
  • Sampling rate: 0.6ms ±0.3ms
  • Finest resolution:0.1μΩ
mΩ HiTESTER 3540
  • For coil up or line resistance measurement
  • Testing source:DC
  • Minimum response time:100ms
  • Sampling speed: 16times/sec.
  • Finest resolution:10μΩ
AC mΩ HiTESTER 3560
  • For contact resistance or battery internal resistance measurement
  • Testing source:AC 1kHz
  • Minimum response time:84ms
  • Sampling speed: 60times/sec.
  • Finest resolution:1μΩ
DIGITAL PRINTER 9203
  • Prints out measurement data at fixed intervals
  • for 3227, 3540, 3560, 3550, 3551
Multi Meter series  
Multi Meter series
Multi Meter series
  • Multi-function and high-accuracy type
  • 199,999 count display
  • High-speed sampling
  • True RMS rectifier
Battery Testers
BATTERY HiTESTER 3561 BATTERY HiTESTER 3554 BATTERY HiTESTER 3555
BATTERY HiTESTER 3561
  • The Perfect Battery Tester for the Production Line
  • Testing source AC 1kHz
  • EXT I/O, RS-232C, GP-IB
BATTERY HiTESTER 3554
  • Auto-hold and auto-data storage
  • batteries: UPS and similar applications
  • Store up to 4800 sets of data
BATTERY HiTESTER 3555
  • For compact storage batteries: portable telephones and similar applications
  • Check battery deterioration