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Component Testing Instruments Index |
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All information correct as of November 1, 2002. All specifications are subject to change without notice. |
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Milliohm Testers and High-precision DMMs - For low resistance measurement |
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Testing source DC |
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100 ms response |
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16 times/sec. sampling |
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Comparator (buzzer only) |
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Wide measurement range |
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0.1µΩ(20m Ωrange) to 110MΩ |
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High speed and High precision |
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Testing source AC 1kHz |
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50/60 times/sec. sampling |
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Comparator output, full |
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remote control, RS-232C |
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included GP-IB or Printer |
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interface optiononly |
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Prints out measurement |
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data at fixed intervals |
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for 3227, 3540, 3560, 3550, 3551 |
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Multi-function and high-accuracy type |
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199,999 count display |
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High-speed sampling |
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True RMS rectifier |
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For compact storage batteries: portable |
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telephones and similar applications |
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Check battery deterioration |
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The Perfect Battery Tester for the Production Line |
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Testing source AC 1kHz |
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EXT I/O, RS-232C, GP-IB |
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Auto-hold and auto-data storage |
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batteries: UPS and similar applications |
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Store up to 4800 sets of data |
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Inductance, Capacitance, Impedance measurement |
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|Z|, L, C, R testing |
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Testing source frequency: 100kHz to 120MHz |
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Measuring time: 6msec |
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|Z|, L, C, R testing |
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Testing source frequency: 42Hz to 5MHz |
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Measuring time: 5msec |
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|Z|, L, C, R testing |
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Testing source frequency: DC, 1mHz to 100kHz |
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Measuring time: 5msec |
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|Z|, L, C, R testing |
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Testing source frequency: 120Hz or 1kHz |
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Measuring time: 5msec |
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Capacitance measurement for production lines |
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C, D (tan δ), Q testing |
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Measure low capacitance |
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Testing source frequency: 1kHz, 1MHz |
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Measuring time: 2msec |
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RS-232C, GP-IB |
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C, D (tan δ), Q testing |
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Measure low capacitance |
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Testing source frequency: 1kHz, 100kHz, 1MHz |
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Measuring time: 2msec |
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RS-232C, GP-IB |
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C, D (tan δ) testing |
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Measure high capacitance MLCC |
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BIN function |
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Contact check function |
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Testing source frequency: 120Hz or 1kHz |
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Measuring time: 2msec |
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RS-232C, GP-IB |
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C, D (tan δ) testing |
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Measure high capacitance MLCC |
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BIN function |
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Testing source frequency: 120Hz or 1kHz |
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Measuring time: 2msec |
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RS-232C, GP-IB |
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C, D (tan δ) testing |
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Measure high capacitance MLCC |
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Testing source frequency: 120Hz or 1kHz |
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Measuring time: 2msec |
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RS-232C |
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C testing only |
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Testing source signal: 4V DC |
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Recharge time measurement method |
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Analog meter type |
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