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Bare board test equipment: Flying probe type < In-Circuit & Bare Board Testers < Products
Bare board test equipment: Flying probe type
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Flying probe type testers: Product features (Models 1116, 1117, 1270, etc.)
The 1116 is a high-speed pattern tester that uses the capacitance testing method.
Compared to conventional continuity testing methods, this approach enables dramatically faster measurement (actual speeds of 10× and faster for boards with 100 nets and 500 total nodes).
The 1117 and 1270 are double-sided board testers capable of pattern testing using the capacitance testing method as well as IVH low-resistance testing.
Differences in resistance values caused by factors such as slight plating defects can be detected by these systems' 4-wires measurement function.
X-Y C HiTESTER 1116-70

Remarkable high-speed testing at up to 100 steps/second

1116-71: Offline type
1116-72: Robotic transport
1116-73: Offline type with 1945-21 and 1945-22
1116-74: Single robotic transport with 1945-21 and 1945-22
1116-75: Double robotic transport with 1945-21 and 1945-22
  • High-resolution capacitance measurement of 5 aF
  • Extensive electrical measurement capabilities
  • High-precision probing
  • Standard automatic positional alignment function
  • Vacuum clamping for zero dead space
  • Large test area of 610 (W) × 510 (D) mm
  • Fine-pitch support with a minimum inter-probe pitch of just 0.1 mm
  • High-speed soft landing function for minimal probe marks
  • Support for board thicknesses of as thin as 0.1 mm
  • Capacitance measurement method for shortened test times
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X-Y BOARD HiTESTER 1270/1271

Double-sided simultaneous tester designed for maximum cost performance

1270 test area: 394 (W) × 324 (D) mm
1271 test area: 604 (W) × 504 (D) mm
  • High-precision probing (accommodates a minimum pad diameter of 20 μm)
  • High-speed testing (0.012 seconds/step)
  • Continuity and isolation testing (variable in 1 V steps from 1 to 250 V)
  • IVH and through hole low-resistance testing support (4-terminal measurement)
  • 4-terminal resistance testing (resolution: 0.2 μΩ)
  • L/C/R measurement function
  • Capacitance testing support (resolution of 5 aF = 5 × 10-18F)
  • Minimal probe marks
  • Large test area of 500 × 600 mm
  • Minimal probe impact marks
  • Simple operation
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X-Y BOARD HiTESTER 1281

Powerful Support for Boards with Embedded Passive and Active Devices
  • IVH (interstitial via hole) and through hole resistance measurement
  • High-resolution capacitance measurement of 5 aF (1 aF = 10-18F)
  • High-precision probing
  • Simple basic data acquisition
  • High-resistance short detection using capacitance measurement
  • 4-terminal resistance measurement function
  • Large test area of 400(W) × 330(D) mm
  • Minimal probe marks
  • L/C/R measurement function
  • Laser-based board warp correction support (optional)


Proprietary HIOKI editing software consolidates and simplifies the test data
Embedded Passive and Active devices (Option)
EPA-LINE (data editor) Data output using Gerber data and electronic component information.
EPA-LINK (data linking software) Test data generation from EPA-LINE information.
SIMulation value of resistance (Option)
SIM-LINE (theoretical resistance value calculation program) Reference value management using theoretical resistance values.
SIM-LINK (data linking software) Test data generation from SIM-LINE information.
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