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| Flying probe type testers: Product features (Models 1116, 1117, 1270, etc.) |
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The 1116 is a high-speed pattern tester that uses the capacitance testing method.
Compared to conventional continuity testing methods, this approach enables dramatically faster measurement (actual speeds of 10× and faster for boards with 100 nets and 500 total nodes).
The 1117 and 1270 are double-sided board testers capable of pattern testing using the capacitance testing method as well as IVH low-resistance testing.
Differences in resistance values caused by factors such as slight plating defects can be detected by these systems' 4-wires measurement function. |
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| X-Y C HiTESTER 1116-70 |
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Remarkable high-speed testing at up to 100 steps/second

| 1116-71: |
Offline type |
| 1116-72: |
Robotic transport |
| 1116-73: |
Offline type with 1945-21 and 1945-22 |
| 1116-74: |
Single robotic transport with 1945-21 and 1945-22 |
| 1116-75: |
Double robotic transport with 1945-21 and 1945-22 |
- High-resolution capacitance measurement of 5 aF
- Extensive electrical measurement capabilities
- High-precision probing
- Standard automatic positional alignment function
- Vacuum clamping for zero dead space
- Large test area of 610 (W) × 510 (D) mm
- Fine-pitch support with a minimum inter-probe pitch of just 0.1 mm
- High-speed soft landing function for minimal probe marks
- Support for board thicknesses of as thin as 0.1 mm
- Capacitance measurement method for shortened test times
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| X-Y BOARD HiTESTER 1117 |
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Dramatically faster testing with 4-arm, double-sided simultaneous testing
High-speed testing at up to 0.015 seconds/step
- IVH (interstitial via hole) and through hole resistance measurement
- High-resolution capacitance measurement of 5 aF (1 aF = 10-18F)
- High-precision probing
- Simple basic data acquisition
- High-resistance short detection using capacitance measurement
- 4-terminal resistance measurement function
- Large test area of 500 × 600 mm
- Minimal probe marks
- L/C/R measurement function
- Laser-based board warp correction support (optional)
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