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HIOKI Introduces the New IMPEDANCE ANALYZER IM3570
A Single-Device Solution for High-speed Testing under Different Measurement Conditions |
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(Ueda, Nagano, June 28, 2010) HIOKI E.E. CORPORATION is pleased to announce the release of the IM3570 IMPEDANCE ANALYZER in mid-July 2010. The new instrument, which provides a single-device solution for LCR, DCR, and sweep measurement, delivers dramatically shorter measuring times and improved measurement precision compared to previous HIOKI LCR HiTESTERs.
HIOKI expects the new IM3570 to drive increased sales for use in testing applications on production lines for electronic components such as coils, capacitors, and piezoelectric elements as well as in development applications at universities and research facilities operated by private-sector corporations. |
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| WHAT IS AN “IMPEDANCE ANALYZER”? |
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The principal functionality offered by impedance analyzers consists of sweep measurement, a technique for observing the characteristics of the object under test while varying the measurement frequency and measurement voltage through a continuous range of values. Examples of applications in which this functionality plays an important role include development and testing of coils, transformers, capacitors, and piezoelectric elements. In this way, the impedance analyzer is an essential tool in the electronic components market, where demand has been recovering from the effects of the global economic crisis.
*Impedance, a measure of opposition to current in AC circuits, is measured in ohms (Ω). |
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| NEW PRODUCT FEATURES |
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- Single-device solution for high-speed measurement, even when switching between different measurement conditions
The need to take readings of multiple parameters under different conditions (frequency, level) when measuring components such as capacitors sometimes necessitates the use of multiple measuring instruments on a single production line. Because the IM3570 is capable of making continuous measurements at high speed under different measurement conditions, HIOKI provides a single-instrument solution for such applications.
- Twice the testing speed (compared to previous instruments)
Compared to existing HIOKI instruments such as the 3532-50, the IM3570 delivers dramatically shortened measurement times. In LCR mode, the new instrument realizes a testing speed improvement of more than 200% compared to the 5 ms measurement times typically obtained with the older design.
The benefits of the IM3570 are clear in settings such as production lines where 100% inspection of electronic components is required.
- Order-of-magnitude improvement in measurement repeatability (*Over 100 measurements at 1 mΩ)
Low-ESR functional polymer capacitor designs necessitate measurement precision in the order of several milliohms. By improving precision during low-impedance measurement by an order of magnitude compared to previous instruments, the IM3570 ensures operators’ ability to realize stable measurement.
- Extensive range of measurement frequencies
The IM3570 allows frequency band configuration at 5-digit resolution for DC signals and within the range of 4 Hz to 5 MHz (resolution: 0.01 Hz under 1 kHz). This capability allows measurement of resonant frequencies as well as measurement and evaluation of components in a state that approaches operating conditions.
- Fifteen measurement parameters
The IM3570 measures a total of 15 parameters, including Z and Y, and data can be captured to a computer as needed.
- Contact check function for preventing false measurement results
The IM3570 offers contact check functionality for both two- and four-terminal measurement. By preventing measurements from being taken while the measurement electrodes are not in contact with the object under measurement, the instrument helps avoid inadvertent shipment of untested products.
- Broad range of measurement currents and voltages
In addition to normal open loop signal generation, the IM3570 can take into account voltage and current dependence in constant-voltage and constant-current modes. Users can set measurement signal levels over a broad range extending from 5 mV to 5 V and from 10 μA to 50 mA (up to 1 MHz).
- Measurement cables of up to 4m in length
Accuracy is guaranteed to a measurement cable length of 4 m thanks to a design that reduces the effects of cable length through the use of four-terminal-pair measurement. This feature simplifies wiring in automated testing equipment.
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| PRINCIPAL TARGET MARKETS |
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- Electronic components market (coils, capacitors, piezoelectric elements, etc.)
- Universities and corporate research and development departments
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| Principal IM3570 Specifications |
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| Measurement modes |
LCR mode: Measurement under single set of conditions
Analyzer mode: Sweep through measurement frequencies and measurement levels
(Measurement points: 1 to 801; sweep methods: normal sweep or segmented sweep; display: list display or graph display)
Continuous measurement mode: Continuous measurement under saved conditions (of which up to 32 sets can be saved) |
| Measurement parameters |
Z, Y, θ, Rs (ESR), Rp, Rdc (DC resistance), X, G, B, Cs, Cp, Ls, Lp, D (tan δ), Q |
| Measurement ranges |
100 mΩ to 100 MΩ, 12 ranges (all parameters are defined using Z) |
| Basic accuracy |
Z: ±0.08% rdg
θ: ±0.05° |
| Measurement frequencies |
4 Hz to 5 MHz (in 10 mHz to 100 Hz steps) |
| Measurement signal levels |
Normal mode:
V mode, CV mode: 5 mV to 5 Vrms (up to 1 MHz), 10 mV to 1 Vrms (1 MHz to 5 MHz), 1 mVrms steps CC mode: 10 μA to 50 mArms (up to 1 MHz), 10 μA to 10 mArms (1 MHz to 5 MHz), 10 μArms steps
Low-impedance high-precision mode:
V mode, CV mode: 5 mV to 1 Vrms (up to 100 kHz), 1 mVrms steps CC mode: 10 μA to 100 mArms (100 mΩ and 1 Ω ranges up to 100 kHz), 10 μArms steps |
| Output impedance |
Normal mode: 100 Ω
Low-impedance high-precision mode: 10 Ω |
| Display |
5.7-inch color TFT, on/off switchable |
| No. of display digits setting |
Number of display digits can be set from 3 to 7; default setting: 6 digits |
| Measurement time |
0.5 ms (100 kHz, FAST, display off, representative value) |
| Measurement speeds |
FAST/MED/SLOW/SLOW2 |
| DC bias measurement |
Normal mode: 0 to 2.50 V DC (10 mV steps)
Low-impedance high-precision mode: 0 to 1.00 V DC (10 mV steps) |
| DC resistance measurement |
Normal mode: Measurement signal level of 100 mV to 2.5 V DC (10 mV steps)
Low-impedance high-precision mode: Measurement signal level of 100 mV to 1.00 V DC (10 mV steps) |
| Comparator |
LCR mode: Hi/IN/Lo for first and third values
Analyzer mode: Area judgment (Hi/IN/Lo for each point), peak judgment (Hi/IN/Lo for maximum and minimum frequencies and absolute values) |
| Memory function |
Storage of 32,000 data points in the instrument’s internal memory |
| Interfaces |
EXT I/O (handler)
RS-232C
GP-IB
USB (Hi-speed/Full-speed)
USB memory
LAN (10Base-T/100Base-TX) |
| Power supply |
90 to 264 V AC, 50/60 Hz, 150 VA max. |
| Dimensions and weight |
Approx. 330 (W) × 119 (H) × 307 (D) mm, approx. 5.8 kg |
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