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Fast, accurate testing of small-value capacitors
HIOKI C HiTESTERs 3505 and 3506 |
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HIOKI has developed the Model 3505 and 3506 C HiTESTER for measuring small-value capacitors using 1 kHz, 100 kHz or 1 MHz measurement frequencies.
- Small-capacitance-measurement
The 3505 and 3506 C HiTESTER are capacitance measurement instruments capable of measuring at the popular frequencies of 1 kHz, 100 kHz (Model 3505 only) and 1 MHz; as well as measuring loss coefficient D. Measurement ranges of both models are 0.000 fF to 15.0000 μF, and D values of 0.00001 to 1.9900. The lowest range is 220 fF (using 1 MHz), and repeatability accuracy when measuring ultra-small values has been greatly improve over former models. The capability to check for contact errors while measuring has been incorporated, making these models ideal for integration with automatic test equipment.
- A complete line of C meters for low to high capacitances
Addition of the new Model 3505 and 3506 C HiTESTER with the currently available Model 3504 extends the HIOKI line of capacitance measurement instruments to cover a very broad range of small to large values. All models are capable of measuring as quickly as once every 2 ms, which is ideal for integration with taping machines; and for sorter integration, the included BIN function can classify capacitance measurements into as many as 13 or 14 ranks.*1
An essential feature for integrating with automatic test equipment is the external control interface. These devices provide the capability to store up to 70*2 or 99 measurement setting conditions for quick recall by external control, and comparator and bin measurement results can be output via the external interface.
*1 Models 3505 and 3506 provide up to 13 ranks, and the 3504 provides up to 14.
*2 Models 3505 and 3506 store up to 70 setting conditions, and the 3504 stores up to 99. |
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| Overview |
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| Through our market release of Model 3504 C HiTESTER, demand was received from manufacturers of capacitors and of automatic test equipment for capacitance measurement instruments that support smaller-value capacitances. In response, Models 3505 and 3506 were developed to inherit the high-speed testing capability for which Model 3504 gained its favorable reputation, and include the BIN function to classify measured values into ranks, with enhanced stability of measurement accuracy for small-value capacitors. Completing the features needed to easily construct automatic test systems, the 3505 and 3506 C HiTESTERs include as standard the same external I/O, RS-232C and GP-IB interfaces as Model 3504. |
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| Advantages |
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- High-speed measurements in as little as 2 ms (1 ms analog measurement) - Supports high-speed testing in as little as 2 ms (Fast setting), ideal for use with equipment such as taping machines. Measurement speed can be selected from Fast, Normal and Slow.
Enhanced measurement accuracy repeatability - With the lowest measurement range of 220 fF (at 1 MHz), repeatability accuracy of ultra-small value measurements is better than earlier models.
- Enhanced contact checking function - Functions such as chatter detection can detect contact errors while measuring. Measurement objects for which a contact error is detected are judged as ERR rather than FAIL, contributing to improved yield rates.
- Comparator function - Upper and lower limit values can be specified for both first parameter (C) and second parameter (D) values. Judgment results can be indicated by beeper, LED display or external output, and setting values are always displayed.
- Simple operation just by selecting and observing LED displays - Operation consists of simply selecting displayed items on the panel. The specified measurement status is indicated by LED so that it can be easily determined at a glance.
- BIN function - Capacitance measurements can be classified into up to 13 ranks according to measurement value, for easy component screening.
- Trigger-synchronized output function - The measurement voltage is output only after applying a trigger, so that voltage is applied to the sample only when actually measuring. This ensures that a large current does not flow when the sample is first contacted, so minimizing contact wear.
- Store up to 70 measurement setting conditions - Up to 70 measurement setting conditions can be stored for quick response when changing samples on a line with many repeating measurements. Any measurement setting condition can be read via EXT I/O.
- Printer output - Measurement values, comparator results and bin measurement results can be output to the optional Model 9442 printer through the RS-232C interface, convenient when a printout of test result data is needed.
- Standard equipped with EXT I/O, RS-232C and GP-IB - Triggering and loading of measurement setting conditions can be externally controlled. Also, comparator results, bin measurement results and end of measurement signals can be externally output for full integration with automatic test equipment.
- JIS (Japanese Industrial Standard) support - For non-electrolytic capacitors, C-D (tan () measurements at 1 kHz and 1 MHz frequencies along with JIS C 5101-1 can be performed at low cost.
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| Primary Application |
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- Inspection and sorting by capacitor manufacturers
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